Zerrendatu honen arabera: egilea "Sanchez, Juan"
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Loss Measurement of Low RDS Devices Through Thermal Modelling - The Advantage of Not Turning it Fully On
Arruti Romero, Asier; Aizpuru, Iosu (IEEE, 2023)This paper presents and evaluates a novel method for generating power losses on transistors avoiding high currents. These could heat up the circuit tracks, affecting the accurate thermal modeling of the system. The proposed ...