Listar por autor "Skocaj, Danijel"
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A Methodology for Advanced Manufacturing Defect Detection through Self-Supervised Learning on X-ray Images
Intxausti Arbaiza, Eneko; Cernuda, Carlos; Zugasti, Ekhi (MDPI, 2024)In industrial quality control, especially in the field of manufacturing defect detection, deep learning plays an increasingly critical role. However, the efficacy of these advanced models is often hindered by their need ...