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Now showing items 11-14 of 14
Loss Measurement of Low RDS Devices Through Thermal Modelling - The Advantage of Not Turning it Fully On
(IEEE, 2023)
This paper presents and evaluates a novel method for generating power losses on transistors avoiding high currents. These could heat up the circuit tracks, affecting the accurate thermal modeling of the system. The proposed ...
A High Frequency Magnetic Test Bench with Fast Isothermal Measurements for Large Cores
(IEEE, 2023)
This paper presents a magnetic core test-bench that has been developed for high-frequency measurements. The bench is able to perform tests at 1 MHz, 300 V and in a range of 20 °C to 150 °C. It exhibits precise temperature ...
Analytical, FEM and Experimental Study of the Influence of the Airgap Size in Different Types of Ferrite Cores
(IEEE, 2022)
This work reviews and compares different airgap reluctance calculation approaches with experimental results, focusing on the Schwarz-Christoffel transformation. The modelling of the airgap reluctance in two dimensions is ...
Novel Analytical Method for Estimating the Junction-to-Top Thermal Resistance of Power MOSFETs
(IEEE, 2022)
This papers proposes a new methodology for estimating the thermal resistance from the junction-to-top capsule surface. By placing the transistor in a vertical position, without being soldered to any PCB, and sensing the ...