Title
Characterizing the Backscattered Spectrum of Mie SpheresAuthor
Author (from another institution)
xmlui.dri2xhtml.METS-1.0.item-contributorOtherinstitution
https://ror.org/000xsnr85https://ror.org/023ke8y90
https://ror.org/02e24yw40
Instituto de Ciencia de Materiales de Madrid
https://ror.org/01cc3fy72
Version
http://purl.org/coar/version/c_970fb48d4fbd8a85
Rights
© 2023 The AuthorsAccess
http://purl.org/coar/access_right/c_abf2Publisher’s version
https://doi.org/10.1002/lpor.202300665Published at
Laser & Photonics Reviews Vol. 18, N. 2, N. art. 2300665Publisher
WileyKeywords
ODS 9 Industria, innovación e infraestructuraAbstract
This study describes both experimentally and theoretically an important hitherto undiscovered feature of the scattering of micron-sized spherical objects when illuminated with highly focused circularl ... [+]
This study describes both experimentally and theoretically an important hitherto undiscovered feature of the scattering of micron-sized spherical objects when illuminated with highly focused circularly polarized light. This is a regime of high experimental relevance which has not been described in full detail. The experiments are complemented with the analytical formulas explaining the field scattered directed toward the backward hemispace. In particular, it is proven that this field shows a very regular oscillatory dependency with the optical size. This phenomenon is typically hidden in the total scattered field, as the field is scattered much less toward the backward hemisphere than toward the forward one. These regular oscillations are measured experimentally. It is proven that, by analyzing them, it is possible to determine the index of refraction of isolated micron-sized particles, opening new paths for applications in sensing and metrology. [-]
Collections
- Articles - Engineering [639]
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