Browsing by Published at "2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET)"
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On the Cost-Effectiveness of Composite Metamorphic Relations for Testing Deep Learning Systems
(IEEE, 2022)Deep Learning (DL) components are increasing their presence in mission and safety-critical systems, such as autonomous vehicles. The verification process of such systems needs to be rigorous, for which automated solutions ...