Izenburua
A method to extract lumped thermal networks of capacitors for reliability oriented designEgilea
Egilea (beste erakunde batekoa)
Beste instituzio
Universidad del País Vasco/Euskal Herriko Unibertsitatea (UPV/EHU)https://ror.org/02k7wn190
Bertsioa
Bertsio argitaratua
Eskubideak
© 2020 ElsevierSarbidea
Sarbide bahituaArgitaratzailearen bertsioa
https://doi.org/10.1016/j.microrel.2020.113737Non argitaratua
Microelectronics Reliability Vol. 114. N. artículo 113737, 2020Argitaratzailea
ElsevierLaburpena
In this work we propose a procedure based on finite element simulations to compute a lumped-parameter thermal model of capacitors. The extracted Foster or Cauer network coupled to the electrical model ... [+]
In this work we propose a procedure based on finite element simulations to compute a lumped-parameter thermal model of capacitors. The extracted Foster or Cauer network coupled to the electrical model can be useful to evaluate the temperature of capacitors in circuit simulators as SPICE or Simulink. In this way, it is possible to evaluate the expected maximum operative temperature of the capacitor embedded in a circuit before its real application, avoiding unexpected failures since the prototyping stage. Here, we describe the workflow of the method and, finally, the proposed approach will be used for designing snubber capacitors for medium power (60 kW) high frequency AC/AC converter. [-]