Zerrendatu Ikerketa-Artikuluak honen arabera: egilea "5017eceeae33d018ddf8bb5c340a47ab"
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A Methodology for Advanced Manufacturing Defect Detection through Self-Supervised Learning on X-ray Images
Intxausti Arbaiza, Eneko; Cernuda, Carlos; Zugasti, Ekhi (MDPI, 2024)In industrial quality control, especially in the field of manufacturing defect detection, deep learning plays an increasingly critical role. However, the efficacy of these advanced models is often hindered by their need ... -
Validation of Random Forest Machine Learning Models to Predict Dementia-Related Neuropsychiatric Symptoms in Real-World Data
Cernuda, Carlos; Ezpeleta, Enaitz; Alberdi Aramendi, Ane (IOS Press, 2020)Background: Neuropsychiatric symptoms (NPS) are the leading cause of the social burden of dementia but their role is underestimated. Objective: The objective of the study was to validate predictive models to separately ...