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dc.contributor.authorArrieta, Aitor
dc.contributor.authorEtxeberria, Leire
dc.contributor.authorMarkiegi, Urtzi
dc.contributor.authorSagardui, Goiuria
dc.contributor.otherSegura, Sergio
dc.date.accessioned2019-01-16T11:24:49Z
dc.date.available2019-01-16T11:24:49Z
dc.date.issued2018
dc.identifier.issn0950-5849eu_ES
dc.identifier.otherhttps://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=147761eu_ES
dc.identifier.urihttps://hdl.handle.net/20.500.11984/1133
dc.description.abstractContext: Software Product Line (SPL) testing is challenging mainly due to the potentially huge number of products under test. Most of the research on this field focuses on making testing affordable by selecting a representative subset of products to be tested. However, once the tests are executed and some failures revealed, debugging is a cumbersome and time consuming task due to difficulty to localize and isolate the faulty features in the SPL. Objective: This paper presents a debugging approach for the localization of bugs in SPLs. Method: The proposed approach works in two steps. First, the features of the SPL are ranked according to their suspiciousness (i.e., likelihood of being faulty) using spectrum-based localization techniques. Then, a novel fault isolation approach is used to generate valid products of minimum size containing the most suspicious features, helping to isolate the cause of failures. Results: For the evaluation of our approach, we compared ten suspiciousness techniques on nine SPLs of different sizes. The results reveal that three of the techniques (Tarantula, Kulcynski2 and Ample2) stand out over the rest, showing a stable performance with different types of faults and product suite sizes. By using these metrics, faults were localized by examining between 0.1% and 14.4% of the feature sets. Conclusion: Our results show that the proposed approach is effective at locating bugs in SPLs, serving as a helpful complement for the numerous approaches for testing SPLseu_ES
dc.language.isoengeu_ES
dc.publisherElsevier B. V.eu_ES
dc.rights© 2018 Elsevier B. V.eu_ES
dc.subjectSoftware product lineseu_ES
dc.subjectSprectum-based fault localizationeu_ES
dc.subjectFeature modelseu_ES
dc.subjectDebuggingeu_ES
dc.titleSpectrum-based fault localization in software product lineseu_ES
dcterms.accessRightshttp://purl.org/coar/access_right/c_f1cfeu_ES
dcterms.sourceInformation and Software Technologyeu_ES
local.contributor.groupIngeniería del software y sistemaseu_ES
local.description.peerreviewedtrueeu_ES
local.description.publicationfirstpage18eu_ES
local.description.publicationlastpage31eu_ES
local.identifier.doihttps://doi.org/10.1016/j.infsof.2018.03.008eu_ES
local.source.detailsVol. 100. Pp. 18-31. August,eu_ES
oaire.format.mimetypeapplication/pdf
oaire.file$DSPACE\assetstore
oaire.resourceTypehttp://purl.org/coar/resource_type/c_6501eu_ES
oaire.versionhttp://purl.org/coar/version/c_ab4af688f83e57aaeu_ES


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