<?xml version='1.0' encoding='UTF-8'?><?xml-stylesheet href='static/style.xsl' type='text/xsl'?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-21T00:23:28Z</responseDate><request verb="GetRecord" identifier="oai:ebiltegia.mondragon.edu:20.500.11984/1133" metadataPrefix="marc">https://ebiltegia.mondragon.edu/oai/request</request><GetRecord><record><header><identifier>oai:ebiltegia.mondragon.edu:20.500.11984/1133</identifier><datestamp>2024-03-04T17:08:32Z</datestamp><setSpec>com_20.500.11984_473</setSpec><setSpec>col_20.500.11984_478</setSpec></header><metadata><record xmlns="http://www.loc.gov/MARC21/slim" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:doc="http://www.lyncode.com/xoai" xsi:schemaLocation="http://www.loc.gov/MARC21/slim http://www.loc.gov/standards/marcxml/schema/MARC21slim.xsd">
   <leader>00925njm 22002777a 4500</leader>
   <datafield ind2=" " ind1=" " tag="042">
      <subfield code="a">dc</subfield>
   </datafield>
   <datafield ind2=" " ind1=" " tag="720">
      <subfield code="a">Arrieta, Aitor</subfield>
      <subfield code="e">author</subfield>
   </datafield>
   <datafield ind2=" " ind1=" " tag="720">
      <subfield code="a">Etxeberria, Leire</subfield>
      <subfield code="e">author</subfield>
   </datafield>
   <datafield ind2=" " ind1=" " tag="720">
      <subfield code="a">Markiegi, Urtzi</subfield>
      <subfield code="e">author</subfield>
   </datafield>
   <datafield ind2=" " ind1=" " tag="720">
      <subfield code="a">Sagardui, Goiuria</subfield>
      <subfield code="e">author</subfield>
   </datafield>
   <datafield ind2=" " ind1=" " tag="260">
      <subfield code="c">2018</subfield>
   </datafield>
   <datafield ind2=" " ind1=" " tag="520">
      <subfield code="a">Context:&#xd;
Software Product Line (SPL) testing is challenging mainly due to the potentially huge number of&#xd;
products under test. Most of the research on this field focuses on making testing affordable by selecting a&#xd;
representative subset of products to be tested. However, once the tests are executed and some failures revealed,&#xd;
debugging is a cumbersome and time consuming task due to difficulty to localize and isolate the faulty features&#xd;
in the SPL.&#xd;
Objective:&#xd;
This paper presents a debugging approach for the localization of bugs in SPLs.&#xd;
Method:&#xd;
The proposed approach works in two steps. First, the features of the SPL are ranked according to their&#xd;
suspiciousness (i.e., likelihood of being faulty) using spectrum-based localization techniques. Then, a novel fault&#xd;
isolation approach is used to generate valid products of minimum size containing the most suspicious features,&#xd;
helping to isolate the cause of failures.&#xd;
Results:&#xd;
For the evaluation of our approach, we compared ten suspiciousness techniques on nine SPLs of different&#xd;
sizes. The results reveal that three of the techniques (Tarantula, Kulcynski2 and Ample2) stand out over the rest,&#xd;
showing a stable performance with different types of faults and product suite sizes. By using these metrics, faults&#xd;
were localized by examining between 0.1% and 14.4% of the feature sets.&#xd;
Conclusion:&#xd;
Our results show that the proposed approach is effective at locating bugs in SPLs, serving as a helpful&#xd;
complement for the numerous approaches for testing SPLs</subfield>
   </datafield>
   <datafield ind1="8" ind2=" " tag="024">
      <subfield code="a">0950-5849</subfield>
   </datafield>
   <datafield ind1="8" ind2=" " tag="024">
      <subfield code="a">https://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&amp;ficha_no=147761</subfield>
   </datafield>
   <datafield ind1="8" ind2=" " tag="024">
      <subfield code="a">https://hdl.handle.net/20.500.11984/1133</subfield>
   </datafield>
   <datafield tag="653" ind2=" " ind1=" ">
      <subfield code="a">Software product lines</subfield>
   </datafield>
   <datafield tag="653" ind2=" " ind1=" ">
      <subfield code="a">Sprectum-based fault localization</subfield>
   </datafield>
   <datafield tag="653" ind2=" " ind1=" ">
      <subfield code="a">Feature models</subfield>
   </datafield>
   <datafield tag="653" ind2=" " ind1=" ">
      <subfield code="a">Debugging</subfield>
   </datafield>
   <datafield ind2="0" ind1="0" tag="245">
      <subfield code="a">Spectrum-based fault localization in software product lines</subfield>
   </datafield>
</record></metadata></record></GetRecord></OAI-PMH>