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dc.contributor.authorCABEZUELO ROMERO, DAVID
dc.contributor.otherDelmonte, Nicola
dc.contributor.otherKortabarria Iparragirre, Iñigo
dc.contributor.otherSantoro, Danilo
dc.contributor.otherToscani, Andrea
dc.contributor.otherCova, Paolo
dc.date.accessioned2024-05-17T12:54:17Z
dc.date.available2024-05-17T12:54:17Z
dc.date.issued2020
dc.identifier.issn0026-2714en
dc.identifier.otherhttps://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=161601en
dc.identifier.urihttps://hdl.handle.net/20.500.11984/6413
dc.description.abstractIn this work we propose a procedure based on finite element simulations to compute a lumped-parameter thermal model of capacitors. The extracted Foster or Cauer network coupled to the electrical model can be useful to evaluate the temperature of capacitors in circuit simulators as SPICE or Simulink. In this way, it is possible to evaluate the expected maximum operative temperature of the capacitor embedded in a circuit before its real application, avoiding unexpected failures since the prototyping stage. Here, we describe the workflow of the method and, finally, the proposed approach will be used for designing snubber capacitors for medium power (60 kW) high frequency AC/AC converter.en
dc.language.isoengen
dc.publisherElsevieren
dc.rights© 2020 Elsevieren
dc.titleA method to extract lumped thermal networks of capacitors for reliability oriented designen
dcterms.accessRightshttp://purl.org/coar/access_right/c_f1cfen
dcterms.sourceMicroelectronics Reliabilityen
local.description.peerreviewedtrueen
local.identifier.doihttps://doi.org/10.1016/j.microrel.2020.113737en
local.contributor.otherinstitutionhttps://ror.org/000xsnr85en
local.contributor.otherinstitutionhttps://ror.org/02k7wn190
local.source.detailsVol. 114. N. artículo 113737, 2020
oaire.format.mimetypeapplication/pdfen
oaire.file$DSPACE\assetstoreen
oaire.resourceTypehttp://purl.org/coar/resource_type/c_6501en
oaire.versionhttp://purl.org/coar/version/c_970fb48d4fbd8a85en


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