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A method to extract lumped thermal networks of capacitors for reliability oriented design.pdf (3.182Mb)
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Title
A method to extract lumped thermal networks of capacitors for reliability oriented design
Author
CABEZUELO ROMERO, DAVID
Author (from another institution)
Delmonte, Nicola
Kortabarria Iparragirre, Iñigo
Santoro, Danilo
Toscani, Andrea
Cova, Paolo
Other institutions
Universidad del País Vasco/Euskal Herriko Unibertsitatea (UPV/EHU)
Università degli Studi di Parma
Version
Published version
Rights
© 2020 Elsevier
Access
Embargoed access
URI
https://hdl.handle.net/20.500.11984/6413
Publisher’s version
https://doi.org/10.1016/j.microrel.2020.113737
Published at
Microelectronics Reliability  Vol. 114. N. artículo 113737, 2020
Publisher
Elsevier
Abstract
In this work we propose a procedure based on finite element simulations to compute a lumped-parameter thermal model of capacitors. The extracted Foster or Cauer network coupled to the electrical model ... [+]
In this work we propose a procedure based on finite element simulations to compute a lumped-parameter thermal model of capacitors. The extracted Foster or Cauer network coupled to the electrical model can be useful to evaluate the temperature of capacitors in circuit simulators as SPICE or Simulink. In this way, it is possible to evaluate the expected maximum operative temperature of the capacitor embedded in a circuit before its real application, avoiding unexpected failures since the prototyping stage. Here, we describe the workflow of the method and, finally, the proposed approach will be used for designing snubber capacitors for medium power (60 kW) high frequency AC/AC converter. [-]
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