Zerrendatu Ikerketa-Artikuluak honen arabera: non argitaratua "IEEE Transactions on Power Electronics. Vol. 35. N. 3. Pp. 2933-2942. March, 2020"

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    • Simple and Affordable Method for Fast Transient Measurements of SiC Devices 

      Garrido, David; Baraia-Etxaburu, Igor; Arza Alonso, Joseba; Barrenetxea, Manex (IEEE, 2020)
      The measurement of fast voltage and current transients of Silicon Carbide (SiC) devices requires high bandwidth (BW) probes. Commercially available voltage and current probes can be expensive, and, in addition, the delay ...