Listar Ikerketa-Artikuluak por publicado en "IEEE Transactions on Power Electronics. Vol. 35. N. 3. Pp. 2933-2942. March, 2020"
Mostrando ítems 1-1 de 1
-
Simple and Affordable Method for Fast Transient Measurements of SiC Devices
(IEEE, 2020)The measurement of fast voltage and current transients of Silicon Carbide (SiC) devices requires high bandwidth (BW) probes. Commercially available voltage and current probes can be expensive, and, in addition, the delay ...