Title
Reliability of power semiconductor modules: a state-of-the-art reviewOther institutions
Mondragon UnibertsitateaVersion
Published versionDocument type
Journal ArticleLanguage
EnglishRights
© 2025Access
Open accessPublisher’s version
https://doi.org/10.1109/OJPEL.2025.3576994Published at
IEEE Open Journal of Power Electronics Vol. 6. Pp. 1036-1067Publisher
IEEEKeywords
ODS 9 Industria, innovación e infraestructuraODS 12 Producción y consumo responsables
Subject (UNESCO Thesaurus)
Electronic technologyUNESCO Classification
Electronic technologyCollections
- Articles - Engineering [894]
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