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Single-Crystal Inspection Using an Adapted Total Focusing Method

dc.rights.licenseAttribution 4.0 International
dc.contributor.authorAizpurua Maestre, Iratxe
dc.contributor.authorDe Miguel, Aitor
dc.contributor.authorLanzagorta, Jose Luis
dc.contributor.authorCarcreff, Ewen
dc.contributor.authorGaldos Errasti, Lander
dc.date.accessioned2026-04-20T07:21:26Z
dc.date.available2026-04-20T07:21:26Z
dc.date.issued2025
dc.identifier.issn1424-8220
dc.identifier.otherhttps://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=189483
dc.identifier.urihttps://hdl.handle.net/20.500.11984/14259
dc.format.extent15 p.
dc.language.isoeng
dc.publisherMDPI
dc.rights© 2025
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.titleSingle-Crystal Inspection Using an Adapted Total Focusing Method
dcterms.accessRightshttp://purl.org/coar/access_right/c_abf2
dcterms.sourceSensors
local.contributor.groupProcesos avanzados de conformación de materiales
local.description.peerreviewedtrue
local.identifier.doihttps://doi.org/10.3390/s25103157
local.contributor.otherinstitutionhttps://ror.org/00wvqgd19
local.source.detailsVol. 25. N. 10. N. art. 3157, 2025
oaire.format.mimetypeapplication/pdf
oaire.file$DSPACE\assetstore
oaire.resourceTypehttp://purl.org/coar/resource_type/c_6501
oaire.versionhttp://purl.org/coar/version/c_970fb48d4fbd8a85
dc.unesco.tesaurohttp://vocabularies.unesco.org/thesaurus/concept625
dc.unesco.clasificacionhttp://skos.um.es/unesco6/3313


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