Listar por publicado en "Annual Conference of the IEEE Industrial Electronics Society (IECON)"
Mostrando ítems 1-1 de 1
-
Comparative Analysis of TSD and NTC-Based Temperature Measurement for Power Semiconductor Modules
(IEEE, 2025)Accurate temperature estimation is essential for ensuring the reliability and performance of power semiconductor devices. This paper presents various techniques used in the industry and focuses on a comparative analysis ...





