Browsing by Published at "ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM)"

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How Do Deep Learning Faults Affect AI-Enabled Cyber-Physical Systems in Operation? A Preliminary Study Based on DeepCrime Mutation Operators

Arrieta, Aitor; Valle Entrena, Pablo; Iriarte, Asier; Illarramendi, Miren (IEEE, 2023)

Cyber-Physical Systems (CPSs) combine digital cyber technologies with physical processes. As in any other software system, in the case of CPSs, the use of Artificial Intelligence (AI) techniques in general, and Deep Neural ...