Zerrendatu honen arabera: egilea "Portillo Cancho, Ane"
-
Comparative Analysis of TSD and NTC-Based Temperature Measurement for Power Semiconductor Modules
Agirrezabala, Eneko; Portillo Cancho, Ane; Lajas Garcia, Miguel; Aizpuru, Iosu; Garrido, David (IEEE, 2025)Accurate temperature estimation is essential for ensuring the reliability and performance of power semiconductor devices. This paper presents various techniques used in the industry and focuses on a comparative analysis ...





