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Zerrendatu honen arabera: egilea "Pérez-Cebolla, Francisco José"

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    • Analytical, FEM and Experimental Study of the Influence of the Airgap Size in Different Types of Ferrite Cores 

      Arruti Romero, Asier; Anzola, Jon; Aizpuru, Iosu; Mazuela, Mikel (IEEE, 2022)
      This work reviews and compares different airgap reluctance calculation approaches with experimental results, focusing on the Schwarz-Christoffel transformation. The modelling of the airgap reluctance in two dimensions is ...
    • The composite improved generalized steinmetz equation (ciGSE): an accurate model combining the composite waveform hypothesis with classical approaches 

      Arruti Romero, Asier; Anzola, Jon; Aizpuru, Iosu; Mazuela, Mikel (IEEE, 2024)
      Predicting core losses is a difficult task for designing magnetic components. Under triangular current waveforms the classical approaches work with duty cycles close to 0.5 but are inaccurate for high and low duty cycles. ...
    • Estimation of Semiconductor Power Losses Through Automatic Thermal Modeling 

      Arruti Romero, Asier; Aizpuru, Iosu (IEEE, 2024)
      Achieving the optimal design of power converters requires a deep understanding of the system's dissipation elements to meet the desired performance and safety standards. Once the power converter is designed, it is of key ...
    • Experimental verification of the AC resistance effect in Insulated Metal Substrate based Power Converters 

      Aizpuru, Iosu; Arruti Romero, Asier; Agirrezabala, Eneko; Mazuela, Mikel (IEEE, 2023)
      Insulated Metal Substrate (IMS) based power converters are an excellent solution for thermal dissipation of power converters, but they suffer for limited layer options generating parasitic elements specially in High ...
    • Loss Measurement of Low RDS Devices Through Thermal Modelling - The Advantage of Not Turning it Fully On 

      Arruti Romero, Asier; Aizpuru, Iosu (IEEE, 2023)
      This paper presents and evaluates a novel method for generating power losses on transistors avoiding high currents. These could heat up the circuit tracks, affecting the accurate thermal modeling of the system. The proposed ...
    • Novel Analytical Method for Estimating the Junction-to-Top Thermal Resistance of Power MOSFETs 

      Arruti Romero, Asier; Aizpuru, Iosu (IEEE, 2022)
      This papers proposes a new methodology for estimating the thermal resistance from the junction-to-top capsule surface. By placing the transistor in a vertical position, without being soldered to any PCB, and sensing the ...

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