Zerrendatu honen arabera: egilea "Ibarrola, Xabier"
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Uncertainty Assessment Framework for IGBT Lifetime Models. A Case Study of Solder-Free Modules
Zubizarreta, Ander; Penalba, Markel; Garrido, David; Markina, Unai; Ibarrola, Xabier; Aizpurua, Jose I. (PHM Society, 2024)Insulated gate bipolar transistors (IGBTs) are ubiquitous semiconductor devices used in diverse electronic power applications. The reliability and lifetime assessment of IGBTs is intricate and influenced by different ageing ...