Zerrendatu honen arabera: egilea "Aizpurua Maestre, Iratxe"
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Enhancing time-of-flight diffraction (TOFD) inspection through an innovative curved-sole probe design
Sanchez Duo, Irati; Dorao Lanzagorta, Jesús; Aizpurua Maestre, Iratxe; Galdos Errasti, Lander (MDPI, 2024) -
Single-Crystal Inspection Using an Adapted Total Focusing Method
Aizpurua Maestre, Iratxe; De Miguel, Aitor; Lanzagorta, Jose Luis; Carcreff, Ewen; Galdos Errasti, Lander (MDPI, 2025)
